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Analog Circuit Design

Analog Circuit Design, Robust Design, Sigma Delta Converters, RFID

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Analog Circuit Design

In this first day of the AACD workshop in Graz, the state-of-the-art of robust design is discussed. The same topic also figured in the AACD program of 2003, also in Graz. The program then focussed on ESD in analog, smart power and RF applications, on EMC in automotive applications and on substrate coupling. The program of this year presents in-depth discussions of robust design in nanometer technologies, in high-temperature and high-voltage environments, in the presence of radiation and of conductive EMC.

The first three contributions deal with different aspects of robust design in nanometer technologies. The first addresses analysis tools and design solutions for the variability and reliability problems in analog circuits in nanometer CMOS technologies. A tool is presented to evaluate the impact of degradation on circuit performance and to identify reliability weak spots. It is also shown how digitally assisted analog design can be used to improve the resilience for variability and degradation of analog circuits.

The second contribution focuses on statistical variability in nanometer CMOS. Discreteness of charge and matter, atomic scale non-uniformities and material granularity are discussed and their expected impact on transistor parameters and on the variability sensitive SRAM cell in sub-45nm technologies is described. It is shown that a seven parameter statistical BSIM model accurately matches the physically simulated device characteristics.

The third paper identifies physical factors, which adversely affect sub-100nm CMOS analog designs and proposes methods for mitigating or overcoming them. It is shown that these methods require design restrictions at the circuit design stage as well as layout restrictions at the physical design stage. The historical separation between circuit and physical design activities must be replaced by a more close cooperation between them.

The next three papers deal with robust design for different hostile environments. The first of these contributions addresses high-temperature and high-voltage integrated electronics and modules for electric power systems in electric and hybrid-electric vehicles. Maximization of the compatibility between semiconductor, pack-aging and material technologies, thermal-electric simulation and reliability calculation of the whole configuration are key elements for robust smart power modules.

The next work is about radiation effects and hardening-by-design techniques in modern deep-sub micron CMOS technologies. Both cumulative and single-event effects are discussed. Hardening-by-design techniques, leveraging on the intrinsic radiation tolerance of CMOS, are detailed for both effects. These techniques allow for the design of robust circuits with high radiation tolerance in a commercial-grade state-of-the-art CMOS technology instead of a dedicated radiation-hard technology.

The last contribution first shows how the standardized direct power injection measurement test bench can be transferred to the simulation environment to predict the EMC immunity of a smart power circuit. This simulation environment is then used to optimize a new methodology for robust high-side smart power switches, based on pin impedance control. Measurements endorse the validity and accuracy
of this approach.

Part I Robust Design .................................................................................... 1
Modeling and Design for Reliability of Analog Integrated
Circuits in Nanometer CMOS Technologies ................................................. 3
Georges Gielen, Elie Maricau and Pieter De Wit
Modeling and Simulation of Statistical Variability in Nanometer
CMOS Technologies ........................................................................................ 17
A. Asenov and B. Cheng
Advanced Physical Design in Nanoscale Analog CMOS ............................. 35
Lanny L. Lewyn
Robust Design for High Temperature and High Voltage Applications ...... 53
τvidiu Vermesan, Edgard Laes, Marco τttella, Mamun Jamal, Jan Kubik,
Kafil M. Razeeb, Reiner John, Harald Gall, Massimo Abrate,
σicolas Cordero and Jan Vcelak
Radiation Effects and Hardening by Design in CMOS Technologies ........ 69
Federico Faccio
EMC Robust Design for Smart Power High Side Switches ........................ 89
Paolo Del Croce and Bernd Deutschmann
Part II Sigma Delta Converters .................................................................. 105
Noise-Coupled Delta-Sigma ADCS ................................................................ 107
Kyehyung Lee and Gabor C. Temes
Very Low OSR Sigma-Delta Converters ...................................................... 135
Comparator-Based Switched-Capacitor Delta-Sigma A/D Converters ..... 157
Koen Cornelissens and Michiel Steyaert
VCO-Based Wideband Continuous-Time Sigma-Delta
Analog-to-Digital Converters ......................................................................... 177
Michael H. Perrott
Wideband Continuous-Time Multi-Bit Delta-Sigma ADCs ........................ 203
J. Silva-Martinez, C.-Y. Lu, M. τnabajo, F. Silva-Rivas, V. Dhanasekaran
and M. Gambhir
Oversampled DACs ........................................................................................ 227
Andrea Baschirotto, Vittorio Colonna and Gabriele Gandolfi
Part III RFID ................................................................................................ 257
RFID, a Technology Ready for Industry Deployment ................................. 259
Henri Barthel
The World’s Smallest RFID Chip Technology ............................................. 277
Mitsuo Usami
RF and Low Power Analog Design for RFID ............................................... 289
Raymond Barnett
A Dual Frequency Band Comprehensive RFID TAG .................................. 313
Albert Missoni, Günter Hofer and Wolfgang Pribyl
Printed Electronics—First Circuits, Products, and Roadmap ................... 333
Jürgen Krumm and Wolfgang Clemens
Towards EPC-Compatible Organic RFID Tags .......................................... 347
Kris Myny, Soeren Steudel, Peter Vicca, Steve Smout,
Monique J. Beenhakkers, σick A. J. M. van Aerle,
François Furthner, Bas van der Putten, Ashutosh K. Tripathi,
Gerwin H. Gelinck, Jan Genoe, Wim Dehaene and Paul Heremans

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